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Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip

Springer New York,
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This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. It Includes built-in testing techniques, linked to current industrial trends.

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Hauptbeschreibung

Titel: Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip
Autoren/Herausgeber: Marvin Onabajo, Jose Silva-Martinez
Ausgabe: 2012

ISBN/EAN: 9781489992963

Seitenzahl: 174
Format: 23,5 x 15,5 cm
Produktform: Taschenbuch/Softcover
Gewicht: 302 g
Sprache: Englisch

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.    Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

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