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Applied Scanning Probe Methods

Volumes I - XIII

Springer Berlin,
1.064,65 € Derzeit nicht lieferbar


Originally published as seperate volumes this series is now available as a full set: a savings of over 40%. 
Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
With this field progressing so fast, the volumes of this series comprise the state of the art of and the progress in the development of the SPM techniques itself, characterization methods as well as biomimetics and industrial application areas.


Titel: Applied Scanning Probe Methods
Autoren/Herausgeber: Bharat Bhushan, Harald Fuchs (Hrsg.)
Aus der Reihe: NanoScience and Technology
Ausgabe: 2009

ISBN/EAN: 9783540888239

Seitenzahl: 4.800
Format: 23,5 x 15,5 cm
Produktform: Buch
Gewicht: 0 g
Sprache: Englisch

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