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Efficient Test Methodologies for High-Speed Serial Links

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Covering new and promising techniques for cost-effectively testing high-speed interfaces with high test coverage, the authors focus on efficient test methodologies for jitter and bit-error-rate, widely used for assessing the quality of communication systems.

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Titel: Efficient Test Methodologies for High-Speed Serial Links
Autoren/Herausgeber: Hong Dongwoo, Kwang-Ting Cheng
Aus der Reihe: Lecture Notes in Electrical Engineering
Ausgabe: 2010

ISBN/EAN: 9789400730946

Seitenzahl: 98
Format: 23,5 x 15,5 cm
Produktform: Taschenbuch/Softcover
Gewicht: 183 g
Sprache: Englisch

Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

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