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Ellipsometry of Functional Organic Surfaces and Films

Springer Berlin,
Buch
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This book provides a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.

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Titel: Ellipsometry of Functional Organic Surfaces and Films
Autoren/Herausgeber: Karsten Hinrichs, Klaus-Jochen Eichhorn (Hrsg.)
Aus der Reihe: Springer Series in Surface Sciences
Ausgabe: Softcover reprint of the original 1st ed. 2014

ISBN/EAN: 9783662510209

Seitenzahl: 363
Format: 23,5 x 15,5 cm
Produktform: Taschenbuch/Softcover
Gewicht: 593 g
Sprache: Englisch

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

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