Suche ›

Infrared Ellipsometry on Semiconductor Layer Structures

Phonons, Plasmons, and Polaritons

Springer Berlin,
255,73 € Lieferbar in 5-7 Tagen
Dieses Produkt ist auch verfügbar als:


The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.


Titel: Infrared Ellipsometry on Semiconductor Layer Structures
Autoren/Herausgeber: Mathias Schubert
Aus der Reihe: Springer Tracts in Modern Physics. Ergebnisse der exakten Naturwissenschaften
Ausgabe: 2004

ISBN/EAN: 9783540232490

Seitenzahl: 196
Format: 23,2 x 15,5 cm
Produktform: Hardcover/Gebunden
Gewicht: 1,060 g
Sprache: Englisch - Newsletter
Möchten Sie sich für den Newsletter anmelden?

Bitte geben Sie eine gültige E-Mail-Adresse ein.
Lieber nicht