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Intermittent Failures in Integrated Circuits

Detection, Characterization and Fault Tolerance

von
Springer New York,
Buch
106,95 € Lieferbar in 2-3 Tagen

Kurzbeschreibung

This book presents a consolidated study of the entire class of intermittent failures, analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault-tolerant design techniques at various levels of abstraction.

Details
Schlagworte
Hauptbeschreibung

Titel: Intermittent Failures in Integrated Circuits
Autoren/Herausgeber: Alodeep Sanyal, Sandip Kundu, Ilia Polian
Ausgabe: 1st ed. 2015

ISBN/EAN: 9781441983145

Seitenzahl: 300
Format: 0 x 0 cm
Produktform: Hardcover/Gebunden
Gewicht: 0 g
Sprache: Englisch

This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.

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