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Minimizing and Exploiting Leakage in VLSI Design

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This book presents two techniques to reduce leakage power in digital VLSI ICs. The first reduces leakage through the selective use of high threshold voltage sleep transistors, while the second by applying the optimal Reverse Body Bias voltage.

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Titel: Minimizing and Exploiting Leakage in VLSI Design
Autoren/Herausgeber: Nikhil Jayakumar, Suganth Paul, Rajesh Garg
Ausgabe: 2010

ISBN/EAN: 9781489985293

Seitenzahl: 214
Format: 23,5 x 15,5 cm
Produktform: Taschenbuch/Softcover
Gewicht: 379 g
Sprache: Englisch

Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in portable/hand-held electronics such as cell-phones and PDAs. This book presents two techniques aimed at reducing leakage power in digital VLSI ICs. The first technique reduces leakage through the selective use of high threshold voltage sleep transistors. The second technique reduces leakage by applying the optimal Reverse Body Bias (RBB) voltage. This book also shows readers how to turn the leakage problem into an opportunity, through the use of sub-threshold logic.

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