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Modeling Nanoscale Imaging in Electron Microscopy

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Springer New York,
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This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

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Titel: Modeling Nanoscale Imaging in Electron Microscopy
Autoren/Herausgeber: Thomas Vogt, Wolfgang Dahmen, Peter Binev (Hrsg.)
Aus der Reihe: Nanostructure Science and Technology
Ausgabe: 2012

ISBN/EAN: 9781489997289

Seitenzahl: 182
Format: 23,5 x 15,5 cm
Produktform: Taschenbuch/Softcover
Gewicht: 302 g
Sprache: Englisch

Thomas Vogt is Director of the NanoCenter Educational Foundation and Distinguished Professor of Chemistry & Biochemistry at the University of South Carolina. Wolfgang Dahmen is a professor at RWTH Aachen.Peter G. Binev is a Professor of Mathematics at the University of South Carolina.

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

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