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Resonant X-Ray Scattering in Correlated Systems

Springer Berlin,
139,09 € Lieferbar ab 26.12.2016


The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.


Titel: Resonant X-Ray Scattering in Correlated Systems
Autoren/Herausgeber: Youichi Murakami, Sumio Ishihara (Hrsg.)
Aus der Reihe: Springer Tracts in Modern Physics. Ergebnisse der exakten Naturwissenschaften
Ausgabe: 1st ed. 2017

ISBN/EAN: 9783662532256

Seitenzahl: 241
Format: 23,5 x 15,5 cm
Produktform: Hardcover/Gebunden
Gewicht: 0 g
Sprache: Englisch

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan.Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan. - Newsletter
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